Contour Probe, WCP

The contour tracer for profile and roughness measurement (patent)

Measuring tasks that have been solved with the aid of contour tracers (also called contour graphs or profilometers) so far, can now be handled with the Werth Contour Probe (patent pending) on a multisensor coordinate measuring machine. The tactile optical contour tracer enables a contour measurement in defined workpiece coordinates for the first time.


The Multisensor Newsletter

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Werth form- and state tolerances Poster

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